Thin films of CdS:Cu, morphological, optical, structural and electrical properties

Authors

  • Fernando J. S. Rodriguez Universidad Autónoma de Sinaloa
  • Jorge N. Angulo Rocha Universidad Autónoma de Sinaloa
  • Francisco Ramos Brito Universidad Autónoma de Sinaloa
  • Cristo M. Yee Rendon Universidad Autónoma de Sinaloa
  • Manuel García hipólito Universidad Nacional Autónoma de México
  • Miguel A. Aguilar Frutis Legaría del Instituto Politécnico Nacional
  • Santos J. Castillo Universidad de Sonora

Keywords:

CdS film, Cu-doped CdS, Low-resistivity CdS, Cu nanoparticles.

Abstract

Thin solid films of CdS:Cu were synthesized using a wet-chemical. Doping was by thermal diffusion. Films were obtained as a function of: precursor salts, deposition time and annealing temperature. Studies of transmittance, resistivity, photoluminescence at room temperature, X-ray diffraction, high-resolution scanning and transmission electron microscopies, were performed. The CdS and CdS:Cu films obtained had an average thickness of 130 nm and 160 nm, respectively. This study provides evidence of the greater effectiveness of sodium citrate than ammonium chloride as a complexing agent. The crystalline phase of the films was cubic and did not vary with deposition time or the precursor. Studies were consistent in showing a film made up of regularly spaced, asterisk-shaped entities of about 35 nm in size, which in turn were composed of nanocrystals smaller than 10 nm. The resulting films behaved as an n-type semiconductor with an energy gap of about 2.38 eV that varied only slightly with deposition time and the precursors’ nature, but increased to 2.93 eV with Cu doping. The resistivity achieved was 5.822 × 10-5 ?-cm. The PL emission spectra showed variation in optical quality and revealed a de-excitation mechanism due to the presence of cadmium vacancies, sulfur vacancies and interstitial cadmium.

Author Biographies

  • Fernando J. S. Rodriguez, Universidad Autónoma de Sinaloa
    Laboratorio de Síntesis de Materiales, Facultad de Ciencias Físico - Matemáticas
  • Jorge N. Angulo Rocha, Universidad Autónoma de Sinaloa
    Laboratorio de Síntesis de Materiales, Facultad de Ciencias Físico - Matemáticas
  • Francisco Ramos Brito, Universidad Autónoma de Sinaloa
    Laboratorio de Síntesis de Materiales, Facultad de Ciencias Físico-Matemáticas
  • Cristo M. Yee Rendon, Universidad Autónoma de Sinaloa
    Laboratorio de Óptica, Facultad de Ciencias Físico-Matemáticas
  • Manuel García hipólito, Universidad Nacional Autónoma de México
    Instituto de Investigaciones en Materiales
  • Miguel A. Aguilar Frutis, Legaría del Instituto Politécnico Nacional
    Centro de Investigación en Ciencia Aplicada y Tecnología Avanzada
  • Santos J. Castillo, Universidad de Sonora
    Departamento de Investigación en Física

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Published

2016-09-15

Issue

Section

Research Papers

How to Cite

Thin films of CdS:Cu, morphological, optical, structural and electrical properties. (2016). Superficies Y Vacío, 29(3), 62-69. https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/80