Characterization of SnO2 thin films deposited on glass by flashing spray pyrolysis for Grätzel-type solar cells
Vol. 26 No. 2 (2013), Research Papers
Vol. 26 No. 2 (2013)

Characterization of SnO2 thin films deposited on glass by flashing spray pyrolysis for Grätzel-type solar cells

Research Papers
Published 2013-06-15
I. Garnica
Instituto Tecnológico de Oaxaca, División de Estudios de Posgrado e Investigación, Departamento de Ingeniería
A. D. Pérez Santiago
Instituto Tecnológico de Oaxaca, División de Estudios de Posgrado e Investigación, Departamento de Ingeniería
Y. Gochi Ponce
Instituto Tecnológico de Oaxaca, División de Estudios de Posgrado e Investigación, Departamento de Ingeniería
F. Paraguay Delgado
Centro de Investigación en Materiales Avanzados, S. C.
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Keywords

Thin films
Spray pyrolysis
Solar cells
Cassiterite. Películas delgadas
Aspersión pirolítica
Celdas solares
Casiterita.

How to Cite

Garnica, I., Pérez Santiago, A. D., Gochi Ponce, Y., & Paraguay Delgado, F. (2013). Characterization of SnO2 thin films deposited on glass by flashing spray pyrolysis for Grätzel-type solar cells. Superficies Y Vacío, 26(2), 36-41. Retrieved from https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/166
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Abstract

SnO2 thin films were deposited on glass substrates by intermittent spray pyrolysis technique, using solution of SnCl45H2O in methanol. Thin films obtained were characterized by X-Ray Diffraction (XRD), UV-VIS spectroscopy, Scanning Electron Microscopy (SEM) and resistivity measurements by Van der Pauw method. According to results, high transmittance in visible light spectrum, cassiterite phase of SnO2 and uniformity of the film across the substrate were determined. Optical, electrical and structural features obtained in material synthesis are appropriate for electrodes in Grätzel solar cells such as high transmittance (>80%), low resistivity (9.28 x 10-03 ?.cm) and high density of carriers (6.24 x 1019 cm-3). Thickness of the film was determined based on transmittance spectra and the crystallite size from XRD diffractogram by Scherrer’s equation.
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