Synthesis of base Pb-Ti thin films deposited by AA-CVD method, crystalographic and microstructural characterization

Authors

  • J. Ramos Cano Facultad de Metalurgia, Universidad Autónoma de Coahuila
  • G. González Zamarripa Facultad de Metalurgia, Universidad Autónoma de Coahuila
  • M. de J. Soria Aguilar Facultad de Metalurgia, Universidad Autónoma de Coahuila
  • P. Amézaga Madrid Centro de Investigación en Materiales Avanzados S.C., and Laboratorio Nacional de Nanotecnología
  • A. Hurtado Macías Centro de Investigación en Materiales Avanzados S.C., and Laboratorio Nacional de Nanotecnología
  • J. González Hernández Centro de Investigación en Materiales Avanzados S.C., and Laboratorio Nacional de Nanotecnología
  • M. Miki Yoshida Centro de Investigación en Materiales Avanzados S.C., and Laboratorio Nacional de Nanotecnología

Keywords:

Thin film, PbTiO3, CVD-AA, Ferroelectric, Perovskite.

Abstract

Thin films of PbTiO3 were deposited at a temperature of 400°C onto Pt/Ti/SiO2/Si <100> substrates by the aerosol assisted CVD method using organometallic precursors. With the purpose of stabilizing and homogenizing the Perovskite phase, the films were annealed at 550°C, in a Pb-rich atmosphere, for 12 h. Thermogravimetric analysis of the precursors were performed to determine the theoretical temperature of deposition. The crystallinity of the phase before and after annealing was characterized by grazing incidence x-ray diffraction. Additionally, microstructural analysis using scanning (SEM) and transmission (TEM) electron microscopy was also performed.

References

Auciello, O.; Scott, J. F.; Ramesh, R.. J. Phys. Today., 51, 22 (1998).

Haertling, G. H. Rainbow Am Ceram. Soc. Bull., 73, 93 (1994).

Whatmore, R.W.; Osband, P.C.; Shorrocks, N.M. Ferroelectrics. 68, 351 (1987).

Yoon, S.; Lee, J.; Safari, A. J. Appl. Phys., 76, 2999 (1994).

R. Waser. Ferroelectrics. 15, 39 (1997).

Dyun, Ch.; Jang, J.W.; Chao, Y.J.; Jai Lee, K.; Lee, B.W. Thin Solid Films., 324, 94 (1998).

Uchino. K.,. Ferroelectric Devices. (Marcel Dekker., Inc. 2000).

Lines. M.E., and Glass. A.M., Principles and Applications of Ferroelectrics and Related Materials. (Clarendon Press-Oxford, 2004).

Wang, D.G.; Chen, C.Z; Ma, J.; Liu, T.H. Appl. Surf. Sci., 255, 1637 (2008).

Xu, Z.; Chan, W. Acta Materialia., 55, 3923 (2007).

Lisca, M.; Pintilie, L.; Alexe, M.; Teodorescu, C.M. Thickness Effect in Pb (Zr0.2Ti0.8)O3 Ferroelectric Thin Films Grown by Pulsed Laser Deposition. Appl. Surf. Sci., 252, 4549 (2006).

Byun, K.; Lee, W. Current Appl. Phys., 7, 113 (2007).

Koo, J.M.; Kim, S.; Shin, S.; Park, Y.; Lee, J.K. Ceramics International., 34, 1003 (2008).

Ramos-Cano, J.; Hurtado-Macias, A.; Antunez-Flores, W.; Fuentes-Cobas, L.; González-Hernández, J.; Amézaga-Madrid, P.; Miki-Yoshida, M. Thin Solid Films., 531,179 (2013).

P.S. Patil, Materials Chemistry and Physics. 59,185 (1999).

D. Perednis, L.J. Gauckler. Journal of Electroceramics. 14,103 (2005).

A.E. Bouchikhi, E.Philippot, M. Et-tabirou, Moroccan J. Condens. Matter. Soc. 8, 69 (2007).

Levi, C.G. Acta Mater. 46, 787 (1998).

D. Bao, X. Yao, N. Wakiya, K. Shinozaki, N. Mizutani, Mater. Sci. Eng. B 94, 269 (2002).

P. Amézaga-Madrid, W. Antúnez-Flores, I. Monárrez- García, J. González-Hernández, R. Martínez-Sánchez, M. Miki- Yoshida, Thin Solid Films 516, 8282 (2008).

P. Amézaga-Madrid, W. Antúnez-Flores, J. González- Hernández, J. Sáenz-Hernández, K. Campos-Venegas, O. Solís- Canto, C. Ornelas-Gutiérrez, O. Vega-Becerra, R. Martínez- Sánchez, M. Miki-Yoshida, J. Alloy Compd. 495, 629 (2010).

Joint Committee on Powder Diffraction Standards, Powder Diffraction File, International Center for Diffraction Data, Swarthmore, PA cards 01, 078 (2006).

Chi, K. K. and Seshu, B. D. Materials Research Society. 310, 429 (1993).

Downloads

Published

2013-12-15

Issue

Section

Research Papers

How to Cite

Synthesis of base Pb-Ti thin films deposited by AA-CVD method, crystalographic and microstructural characterization. (2013). Superficies Y Vacío, 26(4), 143-147. https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/156