Synthesis of base Pb-Ti thin films deposited by AA-CVD method, crystalographic and microstructural characterization
Vol. 26 No. 4 (2013), Research Papers
Vol. 26 No. 4 (2013)

Synthesis of base Pb-Ti thin films deposited by AA-CVD method, crystalographic and microstructural characterization

Research Papers
Published 2013-12-15
J. Ramos Cano
Facultad de Metalurgia, Universidad Autónoma de Coahuila
G. González Zamarripa
Facultad de Metalurgia, Universidad Autónoma de Coahuila
M. de J. Soria Aguilar
Facultad de Metalurgia, Universidad Autónoma de Coahuila
P. Amézaga Madrid
Centro de Investigación en Materiales Avanzados S.C., and Laboratorio Nacional de Nanotecnología
A. Hurtado Macías
Centro de Investigación en Materiales Avanzados S.C., and Laboratorio Nacional de Nanotecnología
J. González Hernández
Centro de Investigación en Materiales Avanzados S.C., and Laboratorio Nacional de Nanotecnología
M. Miki Yoshida
Centro de Investigación en Materiales Avanzados S.C., and Laboratorio Nacional de Nanotecnología
PDF (Español (España))

Keywords

Thin film
PbTiO3
CVD-AA
Ferroelectric
Perovskite. Películas delgadas
PbTiO3
CVD-AA
Ferroeléctrico
Perovskita.

How to Cite

Ramos Cano, J., González Zamarripa, G., Soria Aguilar, M. de J., Amézaga Madrid, P., Hurtado Macías, A., González Hernández, J., & Miki Yoshida, M. (2013). Synthesis of base Pb-Ti thin films deposited by AA-CVD method, crystalographic and microstructural characterization. Superficies Y Vacío, 26(4), 143-147. Retrieved from https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/156
ACM ACS APA ABNT Chicago Harvard IEEE MLA Turabian Vancouver

Download Citation

Endnote/Zotero/Mendeley (RIS) BibTeX

Abstract

Thin films of PbTiO3 were deposited at a temperature of 400°C onto Pt/Ti/SiO2/Si <100> substrates by the aerosol assisted CVD method using organometallic precursors. With the purpose of stabilizing and homogenizing the Perovskite phase, the films were annealed at 550°C, in a Pb-rich atmosphere, for 12 h. Thermogravimetric analysis of the precursors were performed to determine the theoretical temperature of deposition. The crystallinity of the phase before and after annealing was characterized by grazing incidence x-ray diffraction. Additionally, microstructural analysis using scanning (SEM) and transmission (TEM) electron microscopy was also performed.
PDF (Español (España))

References

Auciello, O.; Scott, J. F.; Ramesh, R.. J. Phys. Today., 51, 22 (1998).

Haertling, G. H. Rainbow Am Ceram. Soc. Bull., 73, 93 (1994).

Whatmore, R.W.; Osband, P.C.; Shorrocks, N.M. Ferroelectrics. 68, 351 (1987).

Yoon, S.; Lee, J.; Safari, A. J. Appl. Phys., 76, 2999 (1994).

R. Waser. Ferroelectrics. 15, 39 (1997).

Dyun, Ch.; Jang, J.W.; Chao, Y.J.; Jai Lee, K.; Lee, B.W. Thin Solid Films., 324, 94 (1998).

Uchino. K.,. Ferroelectric Devices. (Marcel Dekker., Inc. 2000).

Lines. M.E., and Glass. A.M., Principles and Applications of Ferroelectrics and Related Materials. (Clarendon Press-Oxford, 2004).

Wang, D.G.; Chen, C.Z; Ma, J.; Liu, T.H. Appl. Surf. Sci., 255, 1637 (2008).

Xu, Z.; Chan, W. Acta Materialia., 55, 3923 (2007).

Lisca, M.; Pintilie, L.; Alexe, M.; Teodorescu, C.M. Thickness Effect in Pb (Zr0.2Ti0.8)O3 Ferroelectric Thin Films Grown by Pulsed Laser Deposition. Appl. Surf. Sci., 252, 4549 (2006).

Byun, K.; Lee, W. Current Appl. Phys., 7, 113 (2007).

Koo, J.M.; Kim, S.; Shin, S.; Park, Y.; Lee, J.K. Ceramics International., 34, 1003 (2008).

Ramos-Cano, J.; Hurtado-Macias, A.; Antunez-Flores, W.; Fuentes-Cobas, L.; González-Hernández, J.; Amézaga-Madrid, P.; Miki-Yoshida, M. Thin Solid Films., 531,179 (2013).

P.S. Patil, Materials Chemistry and Physics. 59,185 (1999).

D. Perednis, L.J. Gauckler. Journal of Electroceramics. 14,103 (2005).

A.E. Bouchikhi, E.Philippot, M. Et-tabirou, Moroccan J. Condens. Matter. Soc. 8, 69 (2007).

Levi, C.G. Acta Mater. 46, 787 (1998).

D. Bao, X. Yao, N. Wakiya, K. Shinozaki, N. Mizutani, Mater. Sci. Eng. B 94, 269 (2002).

P. Amézaga-Madrid, W. Antúnez-Flores, I. Monárrez- García, J. González-Hernández, R. Martínez-Sánchez, M. Miki- Yoshida, Thin Solid Films 516, 8282 (2008).

P. Amézaga-Madrid, W. Antúnez-Flores, J. González- Hernández, J. Sáenz-Hernández, K. Campos-Venegas, O. Solís- Canto, C. Ornelas-Gutiérrez, O. Vega-Becerra, R. Martínez- Sánchez, M. Miki-Yoshida, J. Alloy Compd. 495, 629 (2010).

Joint Committee on Powder Diffraction Standards, Powder Diffraction File, International Center for Diffraction Data, Swarthmore, PA cards 01, 078 (2006).

Chi, K. K. and Seshu, B. D. Materials Research Society. 310, 429 (1993).