Pons Flores CA, Mejía I, Quevedo-Lopez M, Alvarado Beltran C, Reséndiz LM. Influence of active layer thickness, device architecture and degradation effects on the contact resistance in organic thin film transistors. Superficies y Vacio [Internet]. 2017Nov.26 [cited 2024Nov.26];30(3):46-50. Available from: https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/2017_syv30_1-030046