Pons Flores, Cesar Adrian, Israel Mejía, Manuel Quevedo-Lopez, Clemente Alvarado Beltran, and Luis Martín Reséndiz. “Influence of Active Layer Thickness, Device Architecture and Degradation Effects on the Contact Resistance in Organic Thin Film Transistors”. Superficies y Vacío 30, no. 3 (November 26, 2017): 46-50. Accessed November 23, 2024. https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/2017_syv30_1-030046.