PONS FLORES, C. A.; MEJÍA, I.; QUEVEDO-LOPEZ, M.; ALVARADO BELTRAN, C.; RESÉNDIZ, L. M. Influence of active layer thickness, device architecture and degradation effects on the contact resistance in organic thin film transistors. Superficies y Vacío, [S. l.], v. 30, n. 3, p. 46-50, 2017. DOI: 10.47566/2017_syv30_1-030046. Disponível em: https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/2017_syv30_1-030046. Acesso em: 4 dec. 2021.