JIMÉNEZ, A.; AMBROSIO, R. C.; MIRELES, J. J.; GARCÍA, D.; DE LA HIDALGA, F. J. Analysis of threshold voltage fluctuations due to short channel and random doping effects. Superficies y Vacío, [S. l.], v. 26, n. 1, p. 1-3, 2013. Disponível em: https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/172. Acesso em: 5 may. 2024.