CASTREJÓN SÁNCHEZ, V. H.; CAMPS, E.; CAMACHO LÓPEZ, M. Quantification of phase content in TiO2 thin films by Raman spectroscopy. Superficies y Vacío, [S. l.], v. 27, n. 3, p. 88-92, 2014. Disponível em: https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/141. Acesso em: 21 nov. 2024.