Analysis of threshold voltage fluctuations due to short channel and random doping effects. Superficies y Vacío, [S. l.], v. 26, n. 1, p. 1–3, 2013. Disponível em: https://superficiesyvacio.smctsm.org.mx/index.php/SyV/article/view/172. Acesso em: 4 apr. 2025.