Influence of active layer thickness, device architecture and degradation effects on the contact resistance in organic thin film transistors | Superficies y Vacío

Influence of active layer thickness, device architecture and degradation effects on the contact resistance in organic thin film transistors

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Published by: Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales, A.C.
Av. Instituto politécnico Nacional 2508, San Pedro Zacatenco
Gustavo A. Madero, 07360, Ciudad de México, Mexico.
Phone: (+52) 5557473828
http://www.smctsm.org.mx

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